About: http://webisa.webdatacommons.org/281397143

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	The LBIST test pattern is applied to the device under test and multiple system clock sequences with variable loop control are applied in a failing operating region for the device under test and scan data is unloaded.
http://www.w3.org/ns/prov#wasQuotedFrom	faqs.org