| http://www.w3.org/ns/prov#value | - Provided according to the present invention is a method of positioning an E-O probe applied to an apparatus for the measurement of voltage comprising a magnifying optical system for observing a surface of a device to be measured in focus, an E-O probe, a laser beam for the measurement of voltage of the device entering thereto in the state where the E-O probe approximates to said device, a probe st
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