PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • The interconnect 40A (FIG. 5A) can be formed using substantially the same process steps outlined in FIGS. 7A-7F. However, with the substrate 42A comprising a semiconducting material, such as silicon, additional insulating layers 64A can be formed substantially as previously described.
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