About: http://webisa.webdatacommons.org/298024016

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	Therefore, increase in the number of chips for simultaneous measurement test in the probe card is a significant matter for those concerned with the manufacture of probe cards in a wafer testing section.
http://www.w3.org/ns/prov#wasQuotedFrom	google.com