PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • From equation (5) above, it is evident that the shorter the time T to scan along a sweep such as 50, the shorter will be the time required to scan the entire wafer and therefore the higher the throughput.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.com