PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • The method of manufacturing the semiconductor device according to claim 13, wherein the step of forming the barrier layer is a step of oxidizing the surface of the first crystalline semiconductor film with a solution containing ozone.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.com