| http://www.w3.org/ns/prov#value | - The method and system involves providing a material, such as a semiconductor wafer, using a non-vibrating contact potential difference sensor to scan the wafer, generate contact potential difference data and processing...http://www.google.com/patents/US6957154?utm_source=gb-gplus-sharePatent US6957154 - for characterization of microscopic and macroscopic defects through imaging and visualization o
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