PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • That is, one of the AND circuit of the distributed testing logical circuit T0 is formed of a NAND gate circuit NAG1 and an inverter circuit N1 and the other AND circuit is formed of a NAND gate circuit NAG2 and an inverter circuit N2.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.com