| http://www.w3.org/ns/prov#value | - having an odd number of oscillator elements interconnected serially in an infinite loop, wherein at least one the target PFET component is integrated into the ring oscillator and a test output providing a point to measure at least one parameter of the ring oscillator. [0040] As a third aspect of the present invention, described herein is a method of testing a PFET (p-channel field effect transist
|
