PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • The substrate processing apparatus according to the present invention can favorably be utilized in a system of manufacturing semiconductor devices for conducting deposition of thin layers, annealing, diffusion of impurities, and etching processed over a substrate such as a silicon wafer or a glass substrate as is applicable to a range of heating from the room temperature to 1400??? C. The heating
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.fr