| http://www.w3.org/ns/prov#value | - These type of defects often cause the circuit elements such as capacitors, resistors, transistors, current sources, and similar others, to bemismatched, thereby causing non-linearity in the circuit properties, which manifests itself as signal distortion and noise.An apparatus in the form of an improved wafer having a built-in monitoring circuit that is operable to measure noise generated by defect
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