PropertyValue
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  • The test pads are formed in shapes such as letters or objects so that they are less recognizable as test pads.Related Terms: Semiconductor Browse recent Sandisk Technologies Inc. patentsUSPTO Applicaton #: #20130033284 - Class: 32476201 (USPTO) - 02/07/13 - Class 324 Inventors: Arie Frenklakh The Patent Description & Claims data below is from USPTO Patent Application 20130033284, Disguising test p
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