| http://www.w3.org/ns/prov#value | - The above-described box 301 may be used singly as shown in FIG. 22A or alternatively a plurality of the boxes 301 may be used in stacked form by inserting the standoffs 325 into the corresponding standoff fixing holes 326 as shown in FIG. 22B. By so doing, the desired tests can be performed very deftly in cases where different kinds of electronic components are tested, where the test contents are
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