| http://www.w3.org/ns/prov#value | - The invention is particularly useful for lenses that produce a magnetic field at the surface of the sample of greater than 0.025 T, greater than 0.05 T, or greater than 0.1 T. A preferred embodiment deflects the ion beam so that it passes through the ion beam objective lens near its center and deflects the beam so that the ions land at about the same point at which they would have landed in the ab
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