| http://www.w3.org/ns/prov#value | - The interest of the transparent test algorithms is that testing preserves the contents of the RAM. The transparent test algorithm is then used to implement a transparent BIST. This kind of BIST is very suitable for periodic testing of RAMs. The theoretical analysis shows that this transparent BIST technique does not decrease the fault coverage for modeled faults, it behaves better for unmodeled on
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