| http://www.w3.org/ns/prov#value | - One mode of the present invention is a method of manufacturing an analytical sample, which includes forming a thin film or a thin-film stack body to be analyzed over a substrate, attaching a supporting body to the outermost surface of the thin film or the outermost surface of the top layer of the thin-film stack body, and separating the thin film or the thin-film stack body from the substrate.
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