PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • Alternatively, one or more of the foregoing processing units, including the metrology unit, can be positioned external to a housing that encloses one or more of the remaining units. [0063] For purposes of the present application, a microelectronic workpiece is defined to include a workpiece formed from a substrate, such as a silicon wafer, upon which microelectronic circuits or components, data st
http://www.w3.org/ns/prov#wasQuotedFrom
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