| http://www.w3.org/ns/prov#value | - FIG. 2 illustrates a general hierarchical built-in self-test (BIST) scheme for a system chip and its subsystems. (For example, a laptop system may have subsystems such as multi-media, video, audio, modem, interface, etc.) Particularly, FIG. 2 illustrates a general hierarchy that may be utilized in accordance with at least one presently preferred embodiment of the present invention.
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