| http://www.w3.org/ns/prov#value | - Such exposure as is well known has the effect of reducing the level of charge holding developer material particles, including the carrier particles P1 and P2, on the surface S. The reduction of such charge loosens the particles P1 and P2 and aids their recapture electrostatically by the biased pickup members 44A and 46A. This is because one of the factors affecting the effectiveness, for example,
|
