| http://www.w3.org/ns/prov#value | - ures with simultaneous multiple angle of incidence measurementsUS6853455 *Apr 1, 1999Feb 8, 2005Bio-Rad Laboratories, Inc.Apparatus and methods for fourier spectral analysis in a scanning spot microscopeUS20060158657 *Jan 19, 2006Jul 20, 2006De Lega Xavier CInterferometer for determining characteristics of an object surface, including processing and calibrationUS20060158658 *Jan 19, 2006Jul 20, 20
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