| http://www.w3.org/ns/prov#value | - Further provided by the present invention is a method for testing a plurality of devices in parallel, comprising: a) allocating n test sites; b) allocating m connection sites, such that substantially 2*n???m and associating m devices of an object to the m probe sites; c) applying simultaneously a testing scheme to at most n devices from among the m devices; the up to n devices constitute tested de
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