| http://www.w3.org/ns/prov#value | - Further, since the measurement of IDDQ is a mode for measuring a standby current and measuring a through current developed due to a short-circuit and failure in transistor, it is, in this case, necessary to assuredly supply such a voltage ???V1 that the source and well are brought to the back bias state to thereby reduce leak power of a chip and make it easy to find the failure. [0121] A block dia
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