About: http://webisa.webdatacommons.org/333532724

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	defects such as a breakage or a disconnection of the pole are easy to come to occur, and it is required to certainly detect such a defect during a wafer process and to remove the thin-film magnetic heads having the defect.
http://www.w3.org/ns/prov#wasQuotedFrom	patents.com