| http://www.w3.org/ns/prov#value | - Semiconductor CorporationMethod and apparatus for field-effect transistor current sensing using the voltage drop across drain to source resistance that eliminates dependencies on temperature of the field-effect transistor and/or statistical distribution of the initial value of drain to source resistanceUS6645791Apr 23, 2001Nov 11, 2003Fairchild SemiconductorSemiconductor die package including car
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