| http://www.w3.org/ns/prov#value | - Reliable nanoscale electrical characterization using Graphene-coated Atomic Force Microscope tipsAuthors:M. Lanza, A. Bayerl, M. Reguant, P. Lv, C. Rubio, M. Porti, M. Nafria, H.L. DuanAffilation:Peking University, CNPages:466 - 469Keywords:graphene, CAFM, tip wearing, electrochemical metallization, CVDAbstract:Electrical characterization at the nanoscale is an essential procedure for analyzing th
|
