| http://www.w3.org/ns/prov#value | - electrically testing bare printed circuitsUS6344752 *29 Jul 19995 Feb 2002Tokyo Electron LimitedContactor and production method for contractorUS6452807 *22 May 200017 Sep 2002Micron Technology, Inc.Test interposer for use with ball grid array packages, assemblies and ball grid array packages including same, and methodsUS6462570 *6 Jun 20018 Oct 2002Sun Microsystems, Inc.Breakout board using blind
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