PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • FIG. 4A and FIG. 4B illustrate examples of the manner in which the present invention reconfigures the logic on the device 260 in order to vary the number of scan-in and scan-out pins to accommodate different testers.
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