PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • Otherwise, the yield of such devices would be low.Therefore, various kinds of tests and analyses are performed on the wafers between the processing runs or within the course of one processing run.
http://www.w3.org/ns/prov#wasQuotedFrom
  • patentgenius.com