| http://www.w3.org/ns/prov#value | - apparatus, FIG. 5 is a perspective view of a customer tray used in the IC testing apparatus, FIG. 6 is a partially disassembled perspective view of a test tray used in the IC testing apparatus, FIG. 7 is a disassembled perspective view of an insert according to the present invention used in the IC device testing apparatus, FIG. 8(a) is a view from the above of a body portion of an insert body comp
|
