PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • and texture elements for planarization of microelectronic substratesUS6841991Aug 29, 2002Jan 11, 2005Micron Technology, Inc.Planarity diagnostic system, E.G., for microelectronic component test systemsUS6860798Aug 8, 2002Mar 1, 2005Micron Technology, Inc.Carrier assemblies, planarizing apparatuses including carrier assemblies, and methods for planarizing micro-device workpiecesUS6866566Aug 24, 20
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.com