| http://www.w3.org/ns/prov#value | - a differential voltage of the pair of sensor electrodes, and an apparatus and method for testing the open and short circuits of the patternelectrodes using the same.In accordance with an aspect of the present invention, the above and other objects can be accomplished by the provision of a noncontact type single side probe device including: a noncontact probe electrode which feeds power to a patte
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