| http://www.w3.org/ns/prov#value | - ger than the clock period, thereby making it possible to conduct the test with a stable power supply free ofthe effect of the large power noises due to start/stop or the speed change of the clock.(2) In addition, the electronic circuit is used as a memory circuit supplied with a test pattern including an address signal and an operation control signal, and the read signal for the memory circuit is
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