| http://www.w3.org/ns/prov#value | - The present invention relates to a method for measuring the surface temperature of ionic crystals and in particular, to a non-contact method for measuring the surface temperature distribution of the ionic crystals, such as Al2 O3, MgO, LiNbO3, BaTiO3, Bi12 SiO20 and LiF, during crystal growth.
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