About: http://webisa.webdatacommons.org/38666444

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	The present invention relates in general to the testing of integrated circuits and in particular circuits, systems and methods for testing single chip integrated circuit devices including both logic and memory circuitry.
http://www.w3.org/ns/prov#wasQuotedFrom	google.ca