PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • M???rz 2002Samsung Electronics Co., Ltd.Method of forming semiconductor device pattern including cross-linking and flow baking a positive photoresistUS6364465 *25.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.de