About: http://webisa.webdatacommons.org/395838144

Property	Value
http://www.w3.org/1999/02/22-rdf-syntax-ns#type	http://www.w3.org/ns/prov#Entity
http://www.w3.org/ns/prov#value	The overlay of the gate structure 419 over the insulating layer 415, the third well 411, and/or the drift region 407 is achieved by a process including photolithography patterning and etching.
http://www.w3.org/ns/prov#wasQuotedFrom	freshpatents.com