| http://www.w3.org/ns/prov#value | - There is a method that detects a defective chip by performing a built-in self test (to be referred to as a BIST hereinafter) by using a BIST circuit incorporated into a semiconductor integrated circuit including a memory, and diagnoses faults in the defective chip by using the BIST circuit, thereby extracting candidates of defective portions of the memory.
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