| http://www.w3.org/ns/prov#value | - A method of testing semiconductor devices on a substrate comprising the steps of:placing a test head having a plurality of electrical contacts onto a prober; placing the substrate on a chuck; and adjusting, via computer control, a physical position of the test head while the substrate is on the chuck and the test head is on the prober to adjust a physical position of the test head until one or mor
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