| http://www.w3.org/ns/prov#value | - FIG. 10 is an operational flowchart illustrating a preferred method 200 of manufacture of a test probe access structure 108, 110 on a via 104 of a printed circuit assembly 100, and FIGS. 7A-E include various views of a portion of a printed circuit assembly 100 during manufacture of the test probe access structure 108, 110 in accordance with the method of FIG. 10.
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