PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • The present invention relates to semiconductor memory devices, and more particularly to a semiconductor memory device capable of placing large stress on a specific transistor in a burn-in test mode.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.com