| http://www.w3.org/ns/prov#value | - The gate insulating film 104 can be formed to have a single layer structure or a multilayer structure structure of insulating films containing nitrogen or oxygen such as silicon oxide (SiOx), silicon nitride (SiNx), silicon oxynitride (SiOxNy) (x>y), or silicon nitride oxide (SiNxOy) (x>y) by a known method (such as a sputtering method, an LPCVD method, or a plasma CVD method).
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