PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • 16. The method of claim 1 implemented in a lithography tool wherein the object is a wafer stage and the artifacts are alignment marks.
http://www.w3.org/ns/prov#wasQuotedFrom
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