| http://www.w3.org/ns/prov#value | - Surface characterization data are summarized in Table 1 (below). [0076] C. Thin Film Transistor Performance [0077] Transistor performance was tested at room temperature in air using techniques known in the art, for example as shown in S. M. Sze, Physics of Semiconductor Devices, page 442, John Wiley & Sons, New York, 1981, which is herein incorporated by reference.
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