PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • Any suitable process, such as chemical-mechanical polishing (CMP) or etching, may be employed to remove any excess conductive material and planarize this layer (to achieve the structure shown in FIG. 4C).
http://www.w3.org/ns/prov#wasQuotedFrom
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