| http://www.w3.org/ns/prov#value | - As described above, the LED wafer can be probed, but it is also understood that LED chip, or LED package can be similarly be probed to measure device characteristics such as operating voltage, leakage current, peak and dominant emission wavelength, color-point in the CIE diagram, color rendering index (CRI), correlated color temperature (CCT), color bin, intensity and efficacy.
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