PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • FIG. 3 k schematically illustrates a relationship between electrical measurement data and at least one material characteristic, such as the thickness of a strained semiconductor material, according to further illustrative embodiments.
http://www.w3.org/ns/prov#wasQuotedFrom
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