PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • FIG. 3 is a flow chart showing an operation of detecting a position and an inclination of ICs of a semiconductor wafer, which can be performed before a bump formation operation of FIGS. 1 and 2;
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