PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • Once the photoresist mask 14 is in place as shown in FIG. 1d, a suitable etchant such as dilute hydrofluoric acid, HF, is applied to the exposed portion 18 of the SiO2 layer 12 to remove this portion from the upper surface of the substrate 10.
http://www.w3.org/ns/prov#wasQuotedFrom
  • google.fr