PropertyValue
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://www.w3.org/ns/prov#value
  • Even if the lower surfaces of the semiconductor substrates in FIGS. 2 and 3 are covered with insulating films such as oxide films, measurement can be performed.
http://www.w3.org/ns/prov#wasQuotedFrom
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