| http://www.w3.org/ns/prov#value | - According to the present invention, the BIST routine hardware or microcode is modified to read the DFU and DATA-- READY flags, and the user-provided test pattern, according to FIG. 1B. At the front end of the BIST routine, before the test pattern is applied to any memory cells or functional units, the BIST of the present invention tests whether the DFU flag is set (step 112).
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